Call for Papers

Technical sessions: 

Share your latest developments, research results, practical applications, and best practices within semiconductor manufacturing and advanced process control.

Topics include:

  • Process Level APC
  • Manufacturing Effectivness
  • Smart Manufacturing
  • Packaging & Smart Integration

Submit to the Technical Sessions if your contribution focuses on technology, methods, applications, research results, productivity improvements, or manufacturing innovations.

Abstract master

Special Session 2027

Shaping Europe's Future: Competitive & Sustainable Chip Fabs

Following the success of last year's introduction, the Special Session returns for its second edition and focuses on one of Europe's most important strategic challenges: strengthening its semiconductor manufacturing ecosystem.

This session is designed for contributions that go beyond individual technologies and address broader perspectives on Europe's future semiconductor landscape.

Possible topics include:

  • Competitive semiconductor manufacturing in Europe
  • Sustainable fab concepts and operations
  • Long-term innovation strategies
  • Industrial collaboration and ecosystem development
  • Partnerships between fabs, suppliers, research institutions, and policymakers
  • Scalability and industrialization of future-ready solutions


Contributors are encouraged to demonstrate how their work supports a competitive, resilient, and sustainable European semiconductor ecosystem over the next decade.

Submit to the Special Session if your contribution focuses on strategic impact, collaboration, sustainability, ecosystem development, or the future of semiconductor manufacturing in Europe.

Abstract Master: Special Session

Submission Guidelines:

  • Please fill out the Word “Abstract Master” in advance.
  • Have a speaker photo ready.
  • Then go to the submission tool Sessionize and submit your contribution.
  • All submissions must be made via Sessionize – please prepare your materials before starting the submission process.

At apc|m, you have the opportunity to showcase your topics, products, solutions, and innovations to an engaged audience of specialists. Engage with potential clients and partners in the comfortable setting of a ambiance, set against the backdrop of one of Europe's most picturesque cities.

PREPARE YOUR ABSTRACT

We explicitly call for abstracts that cover the practical application of data analytics and AI in semiconductor manufacturing, for example in one of the following domains:

  • Black Box vs. grey box vs. white box – how to combine engineers’ knowledge with ML / AI methods
  • Combining artificial intelligence with human intelligence (“Industry 4.h”) to accelerate learning and to apply best practices (e.g., process learning, smart repair, …)
  • Experiences in using data lakes vs. legacy data base systems
  • How to foster collaboration with universities and external partners by trustful data exchange, e.g., via (public) cloud platforms
Abstract form
SUBMIT YOUR ABSTRACT FORM
Submit your Paper here!

Young Talent Award

Are you at the beginning of your career, writing your thesis or have you completed an exciting scientific project dealing with current challenges and future needs in advanced process control or increasing efficiency in production? We are looking for abstracts that cover the practical application of data analytics and AI in semiconductor manufacturing.

Submit your abstract by 14 December 2024!

What's in it for your:

  • Chance to win award incl. 500 € & certificate
  • Present your innovative topic to a high-level audience
  • Exclusive opportunity: only six abstracts will be selected
  • Selected talents receive free access to the conference
  • Immerse yourself in the dynamic industry landscape
  • Network with like-minded people and advance your career

In 2024, Hossam Elwan won the award for his work on "CMP Process Modelling using Machine Learning Techniques".

Young Talent Award 2024

APC|M TOPICS

Process Level APC

  • Plasma Based Deposition (PVD, PE-CVD and PE-ALD)
  • Plasma etching for Si and compound materials (RIE)
  • Classical Deposition (CVD, ALD)
  • Plating
  • Lithography & Lithography logistic
  • Thermal, WET
  • CMP
  • Epitaxy
  • Other unit processes
  • Metrology, virtual metrology
  • Defect Density Engineering
  • Process modelling, simulation, digital twin ​​
  • Process control methods at process level, e.g., FDC, Fault Prediction, Run-to-Run Control, Virtual Metrology

Smart Manufacturing

  • Digitization, data analytics
  • Data quality
  • Machine learning & AI
  • Digital twin
  • Fab level process control methods, R2R
  • Yield management
  • Factory data analysis
  • Equipment integration
  • IT infrastructure, IoT, edge-devices, cloud-based systems, quantum computing
  • Cybersecurity, data sharing, conversion techniques and blockchain
  • Fab level process control methods, e.g., FDC, Fault Prediction, Run-to-Run Control, Virtual Metrology 

Manufacturing Effectiveness

  • Equipment productivity
  • Manufacturing productivity and automation
  • Factory modeling and simulation
  • Supply chain integration and optimization
  • Cost management
  • End-of-life equipment challenges
  • Material efficiency
  • Environment and green manufacturing
  • Industry standards, requirements, future needs and roadmaps 

Packaging & Smart Integration

  • Backend and final test
  • Heterogenous Integration
  • APC and smart manufacturing solutions in other precision industries such as electronics, pharmaceutical, chemical

Deadlines

Abstract guidelines and submission

Abstract submission: December 14, 2024
Abstract acceptance: February 14, 2025
Program announcement: February 19, 2025