Call for Papers
Technical sessions:
Share your latest developments, research results, practical applications, and best practices within semiconductor manufacturing and advanced process control.
Topics include:
- Process Level APC
- Manufacturing Effectivness
- Smart Manufacturing
- Packaging & Smart Integration
Submit to the Technical Sessions if your contribution focuses on technology, methods, applications, research results, productivity improvements, or manufacturing innovations.
Special Session 2027
Shaping Europe's Future: Competitive & Sustainable Chip Fabs
Following the success of last year's introduction, the Special Session returns for its second edition and focuses on one of Europe's most important strategic challenges: strengthening its semiconductor manufacturing ecosystem.
This session is designed for contributions that go beyond individual technologies and address broader perspectives on Europe's future semiconductor landscape.
Possible topics include:
- Competitive semiconductor manufacturing in Europe
- Sustainable fab concepts and operations
- Long-term innovation strategies
- Industrial collaboration and ecosystem development
- Partnerships between fabs, suppliers, research institutions, and policymakers
- Scalability and industrialization of future-ready solutions
Contributors are encouraged to demonstrate how their work supports a competitive, resilient, and sustainable European semiconductor ecosystem over the next decade.
Submit to the Special Session if your contribution focuses on strategic impact, collaboration, sustainability, ecosystem development, or the future of semiconductor manufacturing in Europe.
Submission Guidelines:
- Please fill out the Word “Abstract Master” in advance.
- Have a speaker photo ready.
- Then go to the submission tool Sessionize and submit your contribution.
- All submissions must be made via Sessionize – please prepare your materials before starting the submission process.
APC|M TOPICS
Process Level APC
- Plasma Based Deposition (PVD, PE-CVD and PE-ALD)
- Plasma etching for Si and compound materials (RIE)
- Classical Deposition (CVD, ALD)
- Plating
- Lithography & Lithography logistic
- Thermal, WET
- CMP
- Epitaxy
- Other unit processes
- Metrology, virtual metrology
- Defect Density Engineering
- Process modelling, simulation, digital twin
- Process control methods at process level, e.g., FDC, Fault Prediction, Run-to-Run Control, Virtual Metrology
Smart Manufacturing
- Digitization, data analytics
- Data quality
- Machine learning & AI
- Digital twin
- Fab level process control methods, R2R
- Yield management
- Factory data analysis
- Equipment integration
- IT infrastructure, IoT, edge-devices, cloud-based systems, quantum computing
- Cybersecurity, data sharing, conversion techniques and blockchain
- Fab level process control methods, e.g., FDC, Fault Prediction, Run-to-Run Control, Virtual Metrology
Manufacturing Effectiveness
- Equipment productivity
- Manufacturing productivity and automation
- Factory modeling and simulation
- Supply chain integration and optimization
- Cost management
- End-of-life equipment challenges
- Material efficiency
- Environment and green manufacturing
- Industry standards, requirements, future needs and roadmaps
Packaging & Smart Integration
- Backend and final test
- Heterogenous Integration
- APC and smart manufacturing solutions in other precision industries such as electronics, pharmaceutical, chemical