Agenda
Session Chair: Christian Knöll
10:30 - 11:00
Machine-Learning-based Classification of Via Defects in SEM-Images.
Abdelmalek Cherchari | Fraunhofer Institute of Electronic Nano Systems ENAS, Technische Universität Chemnitz
11:00 - 11:30
Unpacking Wafer Analysis Complexity: Using Siamese Networks for a Novel Wafer Map Fingerprint Comparability Approach
Christian Weber | Institute of Knowledge Based Systems and Knowledge Management, University of Siegen
11:30 - 12:00
R&D³: a modern data stack for imec researchers
Wim Vancuyck | Imec
12:00 - 12:30
Quantum Computing in Semiconductor Manufacturing – Potentials and Outlook
Christoph Eichhammer | Fraunhofer Institute for Integrated Systems and Device Technology (IISB)